From Devices to Atoms:   Assessing Perovskite Device Stability and Metastability by Spatially Resolved In-Situ and Targeted Ex-Situ Characterization

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The project will enable rapid characterization of the mechanisms for irreversible degradation versus reversible metastability in perovskites to mitigate reliability concerns and identify pathways to long operational lifetimes in high-performing devices. To accomplish this, the project will develop correlated methods for spatially-resolved in-situ characterization and targeted ex-situ validation from full device to atomic spatial scales and link electro-optical imaging (for future rapid screening) with a defect library built using scanning-probe and electron beam methods. Success in this project will provide tools to industry partners to accelerate progress in achieving high stability and long lifetime devices, validated across multiple perovskite-based technologies.