Integrated Approach to Ancillary Photovoltaic Component Reliability Assessment
Sector: Advanced Electronics • Location: College Park, Maryland, United States of America
Source: Department of Energy (DOE)
This project is developing an integrated approach to assessing the reliability of power electronic components in photovoltaic (PV) systems. The new approach is based on the development of physics-informed degradation models embedded in digital twins, or digital replicas of power electronic components, then validated with accelerated life testing and field data. The team will record the causes of a
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Participants
Sponsoring Agency | Obfuscated Data |
Company | Obfuscated Data |
Status
Original status | closed |
Taiyo status | Obfuscated Data |
Taiyo last update | 00-00-0000 |
Available timestamps | 00-00-0000 |
Available timestamp type | Obfuscated Data |
Contact
Contact name | Obfuscated Data |
Phone | 0000000000 |
ObfuscatedData@email.com | |
Address | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Description
Description | This project is developing an integrated approach to assessing the reliability of power electronic components in photovoltaic (PV) systems. The new approach is based on the development of physics-informed degradation models embedded in digital twins, or digital replicas of power electronic components, then validated with accelerated life testing and field data. The team will record the causes of abnormal behavior in the power electronic devices and the amount of time taken to reach failure, then calibrate and validate against accelerated life testing and field performance and reliability data collected on actual electronic components found in PV systems. |
Original sub-sector | Obfuscated |
Original Currency | USD |
Original budget | 000000000000000 |
Procurement method | Obfuscated Data |
Budget | 000000000000000 |
Location
Region | Obfuscated |
Country | Obfuscated |
State | Obfuscated Data |
County | Obfuscated |
Location | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Source
Source reliability | High |
Data quality score | 100% |
Source | Obfuscated Data |
URL | obfuscated_data,obfuscateddata.com |
More Details
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Article Published Date | Obfuscated Data |
