next-Generation Handling of Optical Stray-light in Telescopes

ongoing

In the ever-evolving realm of space instrumentation, the quest for excellence is endless. Scientists tirelessly pursue optical instruments that can capture the universe in unparalleled clarity. Over the years, instruments have improved through the introduction of innovative design concepts and manufacturing techniques, as well as with the use of better detectors. However, for the most demanding applications, stray light (SL) increasingly emerges as the primary limiting factor. SL must be minimized by design through optimal opto-mechanical layout and material selection. In the most challenging situations, this is however not sufficient and a post-processing correction is necessary to reach the scientific requirements. For that, SL characterization is conducted on-ground, to ensure that the instrument does not present any unexpected defect, and to provide kernels for the SL correction algorithms. However, the capabilities of SL characterization were stretched to their utmost extremes. Identifying defects is extremely complex and often impossible, and SL correction algorithms require SL measurement campaigns which are time consuming and subject to inaccuracies. To enable the development of the next generations of space optical instruments, a new paradigm is necessary. This is my long-term scientific objective and the heart of this project. In that frame, my objective will be to mature a new technology: the SL characterization by use of ultrafast time-of-flight imaging.