Secondary-Electron Imaging through Electron-Beam-Induced Current: a Fast and Easy Approach for 3-Dimensional Characterisation of Nanoparticles

forthcoming

The properties of nanomaterials are essentially determined by their size and three-dimensional (3D) structure, typically assessed by Electron Microscopy (EM) techniques such as Scanning Electron Microscopy or Electron Tomography. Unfortunately, the spatial resolution of SEM is limited and ET suffers from low temporal resolution. Here, we present an alternative approach “Secondary-Electron Electron-Beam-Induced Current (SEEBIC)”, a technique during which a dedicated Transmission Electron Microscopy (TEM) sample holder is used to detect a current that originates from the emission of secondary electrons from the sample. By mapping this signal pixel-by-pixel, an image is produced from which the morphology of nanoparticles (NPs) can be directly measured. While SEEBIC addresses the need for user-friendly and high-throughput morphological characterisation of NPs at high resolution, several challenges need to be tackled to increase the Technology and Commercial Readiness Levels of our invention. We will therefore design and fabricate a second-generation, fully custom SEEBIC holder, with further product development based on close interaction with beta-users and EM vendors. From a business perspective, SEEBIC represents a smart and scalable innovation: it extends the functionality of standard TEM setups during their operational lifetime, without sacrificing other essential capabilities and might offer new opportunities for in situ studies. This flexibility is particularly attractive for academic labs and industrial R&D facilities needing fast and easy 3D characterisation of nanomaterials while maintaining advanced analytical performance.