Specifying Guidelines for Assessing Next Generation Solar Cells

closed

This project will establish guidelines for measuring the performance of emerging photovoltaic (PV) technologies such as perovskite solar cells. The guidelines will help to ensure Australian research laboratories have access to a best practice methodology that is reliable, transferable and accurately reflects the true performance of the devices in the outdoor environment.Key resultsTwo primary sources of error commonly observed during engagement with researcher partners can be traced to correctly setting the illumination level and ensuring the device temperature remains at the reference value. Temperature control is particularly important for any measurements with a significant duration such as Dynamic IV and settled power output (SPO)/settled current at fixed voltage (SCFV). Appropriately calibrated reference cells should be used that have a spectral response similar to the DUT and mismatch corrections should be applied. Lamp characterisation (homogeneity, temporal stability) and correct sample positioning are also required to ensure the illumination level remains correct.The use of Dynamic I-V works well for producing hysteresis free I-V curves and is more closely representative of steady-state conditions. Such curves are a requirement to ensure the measured values are representative of the true device performance. Care should be taken to ensure that the appropriate settling time constants and assessment periods are used to achieve truly reproducible results.The use of settled power output (SPO)/settled current at fixed voltage (SCFV) is able to achieve good estimates of device performance when the bias voltage is well chosen.Both careful stabilisation and pre-conditioning steps are required for repeatable stable measurements. Verification of this should be performed through repeated measurement steps for the stabilisation.Regardless of approach all steps (including device history) should be reported. This includes any rest periods and resting voltage bias levels the device is exposed to prior to measurement as well as a steps used for stabilisation and pre-conditioning.Results that are not independently certified may have errors of at least ±10 % when the above conditions are not considered.

High