logo

Analyzing for Sustainable Electronics System 1 set

Sector: Chemical (Industrial) • Location: Japan

Source: Japan External Trade Organization (JETRO)

Tender
Closed

Classification of the the products to be procured : 2 Nature and quantity of the products to be purchased : Analyzing for Sustainable Electronics System set Type of the procurement : purchase Basi requirements of the procurement : A The Sustainable Electronics Analysis System shall include a transmission electron microscope (TEM), an X-ray small-angle scattering instrument (SAXS), and an X-ray ph

Status
Closed
Sector
Chemical (Industrial), Manufacturing (Industrial), Education
Location
Japan
Updated
3 Nov 2026
Source
Japan External Trade Organization (JETRO)

ConstructChat

Ask ConstructChat about Analyzing for Sustainable Electronics System 1 set

Pick a question to edit it, or write your own.

First answer free · no account

I am a

Tender Information FAQ

Tender Information

3 Q
The tender “Analyzing for Sustainable Electronics System 1 set” is a tender record in Taiyo, linked to the Chemical (Industrial) sector. It is issued for works, goods, or services related to Japan.

Participants

Not available for this record.

Status

Original status

closed

Taiyo status

Closed

Taiyo last update

2026-11-03

Contact

Not available for this record.

Description

Description

Classification of the the products to be procured : 2 Nature and quantity of the products to be purchased : Analyzing for Sustainable Electronics System set Type of the procurement : purchase Basi requirements of the procurement : A The Sustainable Electronics Analysis System shall include a transmission electron microscope (TEM), an X-ray small-angle scattering instrument (SAXS), and an X-ray photoelectron spectroscopy (XPS) instrument. B TEM shall be capable of high-resolution imaging and elemental analysis with sub-nanometer resolution. C SAX shall be capable of performing the following three types of measurements : GI-SAXS/WAX measurements using a rotating anode X-ray source and slits designed to obtain high-resolution and high-intensity two-dimensional diffraction images under high-intensity line beam irradiation. Measurements using an optical system consisting of a rotating anode X-ray source, a confocal mirror, and a circular pinhole slit, compatible with a large sample chamber that allows the use of custom-made attachments under ambient conditions. Simultaneous measurement of two-dimensional diffraction images at 2θ angles of 60° or higher. D XP instrument shall be capable of highly sensitive analysis of the elemental composition and chemical bonding states of material surfaces and interfaces. Time limit for the submission of the requested material : 1 : 0 2 January, 202 Contact point for the notice : Yoichi Suzuki, Procurement Section, Accounting Division, Department of Yonezawa Campus services, Yamagata University, 4-3-1 Jonan Yonezawa-shi Yamagata-ken 992-851 Japan, TEL 0238-26-3009

Location

Country

Japan

Source

Source

Japan External Trade Organization (JETRO)

URL

More Details

Record type

Tender

Sector

Chemical (Industrial), Manufacturing (Industrial), Education

Article published date

2026-03-26

More on this tender

Research

Free account

View all details

You are reading the public part. A free account opens the rest:

  • Every detail on this tender
  • News and media coverage
  • Technical research
View all details

Free account · no card · lands you back on this tender