ATOMIC FORCE MICROSCOPE

2026-11-03

Scope : The University of Wisconsin - Madison is seeking bids for the purchase of an atomic force microscope which will be used for characterizing the nanoelectrical , nanomechanical , and thermal properties of materials and for nanofabrication . TECHNICAL SPECIFICATIONS The University of Wisconsin - Madison is seeking bids for the purchase of an atomic force microscope which will be used for characterizing the nanoelectrical , nanomechanical , and thermal properties of materials and for nanofabrication . Conditions of bid which include the word “ must ” or “ shall ” describe a mandatory requirement . All specifications are defined as mandatory minimum requirements unless otherwise stated . FAILURE TO MEET A MANDATORY REQUIREMENT SHALL DISQUALIFY YOUR BID . If no bidder is able to comply with a given specification , condition of bid or provide a specific item / service requested , Purchasing reserves the right to delete that specification , condition of bid or item without having to complete the bid process again . 1 Are the following modalities supported : YES NO 1 . 1 Atomic force microscopy ( AFM ) 1 . 2 Contact mode in air and liquid 1 . 3 Tapping mode in air and liquid 1 . 4 Conductive AFM ( CAFM ) 1 . 5 Lateral force microscopy ( LFM ) 1 . 6 Torsional force microscopy 1 . 7 Electrostatic force microscopy ( EFM ) 1 . 8 Kelvin probe force microscopy ( KPFM ), including single - pass , sideband , and heterodyne modes 1 . 9 Piezoresponse force microscopy ( PFM ) 1 . 10 Nanoscale time dependent dielectric breakdown ( NTDDB ) 1 . 11 Scanning tunneling microscopy ( STM ) and spectroscopy ( STS ) 1 . 12 Scanning gate microscopy ( SGM ) 1 . 13 Magnetic force microscopy ( MFM ) 1 . 14 Force curves 1 . 15 Viscoelastic mapping 1 . 16 Nanolithography mode 2 Are the following objectives achievable : YES NO 2 . 1 Use CAFM , LFM , STM , and tapping mode to collect atomically resolved images ( i . e ., images in which lattice structure and point defects are resolved ), where our primary materials of interest include 2D materials ( e . g ., graphene , h - BN , MoS2 , and WS2 ), covalent organic frameworks ( COFs ), and isolated organic small - molecules ( e . g ., porphyrins and phthalocyanines ). 2 . 2 Use tapping mode to collect atomically resolved images of 2D materials in liquids . 2 . 3 Use torsional force microscopy to visualize moiré patterns formed in vertical heterostructures of 2D materials . 2 . 4 Use AFM to map the topography of samples . 2 . 5 Use STM to visualize the density of states of conductive samples . 2 . 6 Use AFM and STS to collect I - V spectra at user - defined points across a region of interest . 2 . 7 Use NTDDB to characterize the breakdown voltage of non - conductive samples .

Wisconsin

2026-05-06