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Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)

Sector: Road • Location: Canada

Source: Canada Buy and Sell

Tender
Open

The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.

Status
Bidding
Sector
Road, Government
Location
Canada
Updated
3 Nov 2026
Source
Canada Buy and Sell

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Tender Information

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The tender “Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)” is a tender record in Taiyo, linked to the Road sector. It is issued for works, goods, or services related to Canada.

Participants

Not available for this record.

Status

Original status

open

Taiyo status

Bidding

Taiyo last update

2026-11-03

Contact

Not available for this record.

Description

Description

The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.

Location

Country

Canada

Source

Source

Canada Buy and Sell

URL

More Details

Record type

Tender

Sector

Road, Government

Article published date

2026-02-11

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