Cryogenic Focused Ion Beam - Scanning Electron Microscope, 1 set
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Source: Japan External Trade Organization (JETRO)
Summary (1) The nature and quantity of the products to be purchased: Cryogeni Focused Ion Beam Scanning Electron Microscope, set (2) Time limit of Tender: 5:0 p.m June 16, 202 (3) Contact point for the notice: Accounting Section, Administration Division, Kanagawa Institute of Industrial Science and Technology, Shimoimaizumi 705-1, Ebina City, Kanagawa Prefecture, 243-043 Japan, Phone: (046) 236-15
- Status
- Prospective
- Sector
- LNG, Manufacturing (Industrial)
- Location
- Kanagawa, Japan
- Updated
- 3 Nov 2026
- Source
- Japan External Trade Organization (JETRO)
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Tender Information
Participants
| Not available for this record. |
Status
Original status | prospective |
Taiyo status | Prospective |
Taiyo last update | 2026-11-03 |
Contact
| Not available for this record. |
Description
Description | Summary (1) The nature and quantity of the products to be purchased: Cryogeni Focused Ion Beam Scanning Electron Microscope, set (2) Time limit of Tender: 5:0 p.m June 16, 202 (3) Contact point for the notice: Accounting Section, Administration Division, Kanagawa Institute of Industrial Science and Technology, Shimoimaizumi 705-1, Ebina City, Kanagawa Prefecture, 243-043 Japan, Phone: (046) 236-150 (Ex. 5016) |
Location
Country | Japan |
State | Kanagawa |
Source
Source | Japan External Trade Organization (JETRO) |
URL |
More Details
Record type | Tender |
Sector | LNG, Manufacturing (Industrial) |
Article published date | 2026-04-14 |
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