Cryogenic focused ion beam scanning electron microscopy system 1 set
Sector: LNG • Location: Japan
Source: Japan External Trade Organization (JETRO)
Classification of the products to be procured : 2 Nature and quantity of the products to be purchased : Cryogeni focused ion beam scanning electron microscopy system set Time-limit for the submission of comments : : 2 PM 10, December, 202 Contact point for the notice : Kazuhiro Cho, Harima Procurement Section, Procurement Division, Fiscal Services and Procurement Group, RIKEN. 1-1-1, Kouto, Sayo
- Status
- Closed
- Sector
- LNG
- Location
- Japan
- Updated
- 3 Nov 2026
- Source
- Japan External Trade Organization (JETRO)
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Tender Information
Participants
| Not available for this record. |
Status
Original status | closed |
Taiyo status | Closed |
Taiyo last update | 2026-11-03 |
Contact
| Not available for this record. |
Description
Description | Classification of the products to be procured : 2 Nature and quantity of the products to be purchased : Cryogeni focused ion beam scanning electron microscopy system set Time-limit for the submission of comments : : 2 PM 10, December, 202 Contact point for the notice : Kazuhiro Cho, Harima Procurement Section, Procurement Division, Fiscal Services and Procurement Group, RIKEN. 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5148, Japan, TEL 0791-58-0063 |
Location
Country | Japan |
Source
Source | Japan External Trade Organization (JETRO) |
URL |
More Details
Record type | Tender |
Sector | LNG |
Article published date | 2026-03-26 |
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