Desktop Scanning Electron Microscope Integrated in a Glovebox for the Characterization of Actinide Targets
Sector: Nuclear
Source: Single Electronic Data Interchange Area (SEDIA)
The preparation and characterization of thin actinide layers is essential for nuclear data experiments. A scanning electron microscope (SEM) is an important tool in order to assess and improve the quality of thin layer depositions. Outsourcing of this service is very difficult due to nature of the material (transport and license for the handling of radioactive material). The technical improvement
Tender Information FAQ
Tender Information
Want to explore the full details? View the full report
Participants
Sponsoring Agency | Obfuscated Data |
Company | Obfuscated Data |
Status
Original status | closed |
Taiyo status | Obfuscated Data |
Taiyo last update | 00-00-0000 |
Available timestamps | 00-00-0000 |
Available timestamp type | Obfuscated Data |
Contact
Contact name | Obfuscated Data |
Phone | 0000000000 |
ObfuscatedData@email.com | |
Address | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Description
Description | The preparation and characterization of thin actinide layers is essential for nuclear data experiments. A scanning electron microscope (SEM) is an important tool in order to assess and improve the quality of thin layer depositions. Outsourcing of this service is very difficult due to nature of the material (transport and license for the handling of radioactive material). The technical improvement and down-scaling in the field of electron microscopy towards desktop models enables the possibility for straightforward in-house characterization of large samples at reasonable cost without the requirement of intensive training. |
Original sub-sector | Obfuscated |
Original Currency | USD |
Original budget | 000000000000000 |
Procurement method | Obfuscated Data |
Budget | 000000000000000 |
Location
Region | Obfuscated |
Country | Obfuscated |
State | Obfuscated Data |
County | Obfuscated |
Location | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Source
Source reliability | High |
Data quality score | 100% |
Source | Obfuscated Data |
URL | obfuscated_data,obfuscateddata.com |
More Details
Project Type | Obfuscated Data |
Article Published Date | Obfuscated Data |
