How can I verify the tender source and access bidding documents for “Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set”?

Taiyo’s tender pages link back to the originating system via https://www.jetro.go.jp/en/database/procurement/national/articles/373393/2025112600620001.html, referencing Japan External Trade Organization (JETRO) as the source. Users can follow the official link to download tender documents and submission instructions.

Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set

Q: What is the current bidding status of the tender “Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set”?

The status recorded for “Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set” is closed.

Sector: Education • Location: Japan

Source: Japan External Trade Organization (JETRO)

Tender

Closed

Classification of the products to be procured : 2 Nature and quantity of the products to be rent : Electrical Property Characterization System for Micro-and Nano-Structured Devices Set Time limit for the submission of comments : 1 : 0 1 December, 202 Contact point for the notice : Kitano Tairi, Financial Affairs Department, Contract Management Division, Kumamoto University, 2-39- Kurokami Chuo-k

Status: Closed
Sector: Education
Location: Japan
Updated: 3 Nov 2026
Source: Japan External Trade Organization (JETRO)

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Tender Information

3 Q

The tender “Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set” is a tender record in Taiyo, linked to the Education sector. It is issued for works, goods, or services related to Japan.

Participants

Not available for this record.

Status

Original status	closed
Taiyo status	Closed
Taiyo last update	2026-11-03

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Not available for this record.

Description

Location

Country

Japan

Source

Source	Japan External Trade Organization (JETRO)
URL

More Details

Record type	Tender
Sector	Education
Article published date	2026-03-26

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Electrical Property Characterization System for Micro-and Nano-Structured Devices 1 Set

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