How can I verify the tender source and access bidding documents for “Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument”?

Taiyo’s tender pages link back to the originating system via https://www.bidnetdirect.com/public/supplier/solicitations/statewide/2664635297/abstract?purchasingGroupId=182876351&origin=1, referencing Maryland Purchasing Group as the source. Users can follow the official link to download tender documents and submission instructions.

Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument

Q: What is the current bidding status of the tender “Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument”?

The status recorded for “Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument” is closed.

One of 10,000+ tenders Taiyo tracks in Maryland.

Source: Maryland Purchasing Group

Tender

Closed

This National Institute of Standards and Technology ( NIST ) has a requirement for a Focused Ion Beam ( FIB ) and Scanning Electron Microscope ( SEM ) instrument capable of performing a suite of customized measurements . See attached Solicitation # 1333ND26QNB030053 , and associated Attachments 1 ( SOW ) and 2 ( Applicable

Status: Closed
Location: Maryland, United States of America
Updated: 3 Nov 2026
Source: Maryland Purchasing Group

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Tender Information

3 Q

The tender “Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument” is a tender record in Taiyo. It is issued for works, goods, or services related to Maryland, United States of America.

Participants

Not available for this record.

Status

Original status	closed
Taiyo status	Closed
Taiyo last update	2026-11-03

Contact

Not available for this record.

Description

Location

Country	United States of America (USA)
State	Maryland

Source

Source	Maryland Purchasing Group
URL

More Details

Record type	Tender
Article published date	2026-05-02

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Focused Ion Beam Scanning Electron Microscope ( FIB - SEM ) Instrument

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