Focused Ion Beam Scanning Electron Microscope (Fib-Sem) Instrument
Combined synopsis/solicitation · Maryland
Source: SAM.gov
This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
- Status
- Closed
- Sector
- Residential, Manufacturing (Industrial), Commercial
- Location
- Gaithersburg, Maryland, United States of America
- Updated
- 3 Nov 2026
- Source
- SAM.gov
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Tender Information
Participants
| Not available for this record. |
Status
Original status | combined synopsis/solicitation |
Taiyo status | Closed |
Taiyo last update | 2026-11-03 |
Contact
| Not available for this record. |
Description
Description | This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details. |
Original sector | Not Identified |
Location
Country | United States of America (USA) |
State | Maryland |
City | Gaithersburg |
Source
Source | SAM.gov |
URL |
More Details
Record type | Tender |
Sector | Residential, Manufacturing (Industrial), Commercial |
Article published date | 2026-02-10 |
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