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Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)

Sector: Education • Location: Sweden

Source: TED Europa

Tender
Contract Notice

Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet.

The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at th

Status
Closed
Sector
Education
Location
Sweden
Updated
3 Nov 2026
Source
TED Europa

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Tender Information

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The tender “Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)” is a tender record in Taiyo, linked to the Education sector. It is issued for works, goods, or services related to Sweden.

Participants

Not available for this record.

Status

Original status

contract notice

Taiyo status

Closed

Taiyo last update

2026-11-03

Contact

Not available for this record.

Description

Description

Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.

Original sector

Laboratory, optical and precision equipments (excl. glasses), Laboratory, optical and precision equipments (excl. glasses)

Location

Country

Sweden

Source

Source

TED Europa

URL

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Record type

Tender

Sector

Education

Article published date

2026-07-02

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