What is the current bidding status of the tender “Metrology SEM+FIB system”?

The status recorded for “Metrology SEM+FIB system” is contract notice.

How can I verify the tender source and access bidding documents for “Metrology SEM+FIB system”?

Taiyo’s tender pages link back to the originating system via https://ted.europa.eu/en/notice/-/detail/00519634-2026, referencing TED Europa as the source. Users can follow the official link to download tender documents and submission instructions.

Metrology SEM+FIB system

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Source: TED Europa

Tender

Contract Notice

The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem

Status: Closed
Sector: Metal
Location: Netherlands
Updated: 3 Nov 2026
Source: TED Europa

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Tender Information

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The tender “Metrology SEM+FIB system” is a tender record in Taiyo, linked to the Metal sector. It is issued for works, goods, or services related to Netherlands.

Participants

Not available for this record.

Status

Original status	contract notice
Taiyo status	Closed
Taiyo last update	2026-11-03

Contact

Not available for this record.

Description

Description	The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Original sector	Electrical machinery, apparatus, equipment and consumables; lighting, Laboratory, optical and precision equipments (excl. glasses)

Location

Country

Netherlands

Source

Source	TED Europa
URL

More Details

Record type	Tender
Sector	Metal
Article published date	2026-07-28

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Metrology SEM+FIB system

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