Micro X-Ray Source For Defect Detection In Metallic Am Structures
Sector: Manufacturing (Industrial) • Location: Hampton, Virginia, United States of America
Source: SAM.gov
NASA LaRC has a requirement for a Micro x-ray source for defect detection in metallic AM structures. See the attached SOW for full details of the requirement. All correspondence shough reference ID 80NSSC26922252Q in the subject line for visibility.
- Status
- Closed
- Sector
- Manufacturing (Industrial), Residential, Commercial
- Location
- Hampton, Virginia, United States of America
- Updated
- 3 Nov 2026
- Source
- SAM.gov
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Tender Information
Participants
| Not available for this record. |
Status
Original status | combined synopsis/solicitation |
Taiyo status | Closed |
Taiyo last update | 2026-11-03 |
Contact
| Not available for this record. |
Description
Description | NASA LaRC has a requirement for a Micro x-ray source for defect detection in metallic AM structures. See the attached SOW for full details of the requirement. All correspondence shough reference ID 80NSSC26922252Q in the subject line for visibility. |
Original sector | Not Identified |
Location
Country | United States of America (USA) |
State | Virginia |
City | Hampton |
Source
Source | SAM.gov |
URL |
More Details
Record type | Tender |
Sector | Manufacturing (Industrial), Residential, Commercial |
Article published date | 2026-01-15 |
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