Micro X-Ray Source For Defect Detection In Metallic Am Structures.
Sector: Manufacturing (Industrial) • Location: Hampton, Virginia, United States of America
Source: SAM.gov
NASA/NSSC has a requirement for Micro x-ray source for defect detection in metallic AM structures. See the attached SOW and request for capability statements. All correspondence must reference the notice ID in the subject line for reference. NOTE: Quotes received in response to this notice will NOT be considered and will not be evaluated by NASA’s Technical End User Team. We are currently only req
- Status
- Prospective
- Sector
- Manufacturing (Industrial)
- Location
- Hampton, Virginia, United States of America
- Updated
- 3 Nov 2026
- Source
- SAM.gov
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Status
Original status | special notice |
Taiyo status | Prospective |
Taiyo last update | 2026-11-03 |
Contact
| Not available for this record. |
Description
Description | NASA/NSSC has a requirement for Micro x-ray source for defect detection in metallic AM structures. See the attached SOW and request for capability statements. All correspondence must reference the notice ID in the subject line for reference. NOTE: Quotes received in response to this notice will NOT be considered and will not be evaluated by NASA’s Technical End User Team. We are currently only requesting Capability Statements. |
Original sector | Not Identified |
Location
Country | United States of America (USA) |
State | Virginia |
City | Hampton |
Source
Source | SAM.gov |
URL |
More Details
Record type | Tender |
Sector | Manufacturing (Industrial) |
Article published date | 2026-08-27 |
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