NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam - Field Emission Scanning Electron Microscope (pFIB - SEM)

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In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), Electron Backscatter Diffraction (EBSD) and Scanning-Transmission Electron Microscope (STEM) detectors and allow micro-machining of micro-mechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.