NL-Petten: Supply of an In-situ Micromechanical Testing System for Scanning Electron Microscope
Source: Single Electronic Data Interchange Area (SEDIA)
The JRC Petten plans to purchase an in-situ micromechanical deformation stage to perform micromechanical testing inside the Scanning electron microscope (SEM) model Zeiss Leo Supra 50. The system must allow performing nanoindentation, tensile, bending and compression tests in-situ. It must also allow the mechanical punching of metallic micro-membranes of several micrometers thickness, while simult
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Participants
Sponsoring Agency | Obfuscated Data |
Company | Obfuscated Data |
Status
Original status | closed |
Taiyo status | Obfuscated Data |
Taiyo last update | 00-00-0000 |
Available timestamps | 00-00-0000 |
Available timestamp type | Obfuscated Data |
Contact
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Address | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Description
Description | The JRC Petten plans to purchase an in-situ micromechanical deformation stage to perform micromechanical testing inside the Scanning electron microscope (SEM) model Zeiss Leo Supra 50. The system must allow performing nanoindentation, tensile, bending and compression tests in-situ. It must also allow the mechanical punching of metallic micro-membranes of several micrometers thickness, while simultaneously imaging the deformation process with the Scanning electron microscope (SEM). |
Original sub-sector | Obfuscated |
Original Currency | USD |
Original budget | 000000000000000 |
Procurement method | Obfuscated Data |
Budget | 000000000000000 |
Location
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Country | Obfuscated |
State | Obfuscated Data |
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Location | Obfuscated Data, Obfuscated data, obfuscated data, Obfuscated data |
Source
Source reliability | High |
Data quality score | 100% |
Source | Obfuscated Data |
URL | obfuscated_data,obfuscateddata.com |
More Details
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