How can I verify the tender source and access bidding documents for “Resistivity Measurement System Suite, 4-Point Probe”?

Taiyo’s tender pages link back to the originating system via https://sam.gov/workspace/contract/opp/12c453a86bc8473b8601dc741066bce3/view, referencing SAM.gov as the source. Users can follow the official link to download tender documents and submission instructions.

Resistivity Measurement System Suite, 4-Point Probe

Q: What is the current bidding status of the tender “Resistivity Measurement System Suite, 4-Point Probe”?

The status recorded for “Resistivity Measurement System Suite, 4-Point Probe” is solicitation.

One of 10,000+ tenders Taiyo tracks in Pennsylvania.

Source: SAM.gov

Tender

Solicitation

The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions. Please see attached Statement of Work (SOW) for more specific technical information.

Status: Prospective
Sector: Chemical (Industrial), Advanced Electronics, Manufacturing (Industrial), Geothermal, Residential, Aerospace & Defense, Warehouse, Commercial
Location: Philadelphia, Pennsylvania, United States of America
Updated: 3 Nov 2026
Source: SAM.gov

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Tender Information

3 Q

The tender “Resistivity Measurement System Suite, 4-Point Probe” is a tender record in Taiyo, linked to the Chemical (Industrial) sector. It is issued for works, goods, or services related to Philadelphia, Pennsylvania, United States of America.

Participants

Not available for this record.

Status

Original status	solicitation
Taiyo status	Prospective
Taiyo last update	2026-11-03

Contact

Not available for this record.

Description

Description	The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions. Please see attached Statement of Work (SOW) for more specific technical information.
Original sector	Not Identified

Location

Country	United States of America (USA)
State	Pennsylvania
City	Philadelphia

Source

Source	SAM.gov
URL

More Details

Record type	Tender
Sector	Chemical (Industrial), Advanced Electronics, Manufacturing (Industrial), Geothermal, Residential, Aerospace & Defense, Warehouse, Commercial
Article published date	2026-09-02

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Resistivity Measurement System Suite, 4-Point Probe

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