How can I verify the tender source and access bidding documents for “Semi Automatic Prober for characterization of 200 mm Wafers”?

Taiyo’s tender pages link back to the originating system via https://ted.europa.eu/en/notice/-/detail/00528678-2026, referencing TED Europa as the source. Users can follow the official link to download tender documents and submission instructions.

Semi Automatic Prober for characterization of 200 mm Wafers

Q: What is the current bidding status of the tender “Semi Automatic Prober for characterization of 200 mm Wafers”?

The status recorded for “Semi Automatic Prober for characterization of 200 mm Wafers” is contract notice.

Contract notice · Germany · Last reported Jul 2026

Source: TED Europa

Tender

Contract Notice

Beschaffung eines halbautomatischen Wafer-Probersystems einschließlich eines integrierten Charakterisierungssystems zur elektrischen Charakterisierung von 200-mm-Wafern. Der Leistungsumfang umfasst die Lieferung, Installation, Inbetriebnahme sowie die Einweisung des Bedienpersonals.

Status: Closed
Sector: Road
Location: Frankfurt (Oder), Germany
Updated: 3 Nov 2026
Source: TED Europa

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Tender Information

3 Q

The tender “Semi Automatic Prober for characterization of 200 mm Wafers” is a tender record in Taiyo, linked to the Road sector. It is issued for works, goods, or services related to Frankfurt (Oder), Germany.

Participants

Not available for this record.

Status

Original status	contract notice
Taiyo status	Closed
Taiyo last update	2026-11-03

Contact

Not available for this record.

Description

Description	Beschaffung eines halbautomatischen Wafer-Probersystems einschließlich eines integrierten Charakterisierungssystems zur elektrischen Charakterisierung von 200-mm-Wafern. Der Leistungsumfang umfasst die Lieferung, Installation, Inbetriebnahme sowie die Einweisung des Bedienpersonals.
Original sector	Laboratory, optical and precision equipments (excl. glasses)

Location

Country	Germany
City	Frankfurt (Oder)

Source

Source	TED Europa
URL

More Details

Record type	Tender
Sector	Road
Article published date	2026-07-30

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Semi Automatic Prober for characterization of 200 mm Wafers

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