Sustainable Electronics Process Development system 1 set

2026-11-03

Classification of the the products to be procured : 2 Nature and quantity of the products to be purchased : Sustainable Electronics Process Development system set Type of the procurement : purchase Basi requirements of the procurement : A The Sustainable Electronics Process Development System includes a scanning electron microscope (SEM), a 3D surface profiler, clean booths, a gas and water vapor transmission rate permeation analyzer, a high-intensity VUV light irradiation equipment, a sputtering and atomi layer deposition (ALD) system, a solar cell stability/lifetime testing equipment, a battery charge/discharge test system, a 3D scanner, an antenna radiation pattern measurement system, a dispenser system, and a bonder system, each having their respective capabilities. B The scanning electron microscope (SEM) has a tungsten filament and is equipped with Energy Dispersive X-ray Spectroscopy (EDS/EDX) for elemental analysis. C The 3D surface profiler includes a conventional optical measurement microscope as well as a laser microscope, enabling 3D shape and profile measurement. D The clean booths (1 sets) are equipped with high efficiency particulate air filter (HEPA) units (with an area of m x m or larger for each set). E The gas and water vapor transmission rate permeation analyzer can measure the permeability of various gases (including water vapor) and is capable of measuring the gas/water vapor permeability of high-barrier films. F The high-intensity VUV light irradiation equipment (two sets for gas barrier films and planarization films respectively) is equipped with a high-power Xe lam and can provide uniform irradiation to the sample. G The sputtering and atomi layer deposition (ALD) system includes a sputtering system, an atomi layer deposition (ALD) system, and a transfer system. It is capable of semi-automatically depositing thin films such as nitrides or oxides on substrates of 10 mm x 10 mm square size or larger using sputtering, as well as forming ALD films on the same size substrates. The device can transfer substrates between the two deposition systems in a clean manner. H The solar cell stability/lifetime testing equipment is equipped with a white light source equivalent to SUN and allows for the simultaneous measurement of 1 or more solar cells. It can automatically measure and evaluate the time-dependent changes in solar cell characteristics using MPPT control. I The battery charge/discharge test system is a testing system for battery cycle and performance that can measure the electrochemical properties of energy devices (such as secondary batteries) with high accuracy. It can monitor the state of one to several tens of devices in real-time simultaneously. J The 3D scanner can measure objects using optical measurement methods to capture their three-dimensional shape and length, and can convert the measured data into CAD data. K The antenna radiation pattern measurement system can evaluate the radio wave radiation characteristics of antennas and perform characteristi evaluations from 30 MHz to 1 GHz. L The dispenser system has a stage size large enough to handle 20 mm x 20 mm substrates and is capable of applying fine patterns as small as 10 μm. M The bonder system is capable of mounting chi components onto substrates patterned with antenna patterns using adhesives or other methods. Time limit for the submission of the requested material : 1 : 0 1 February, 202 Contact point for the notice : Takuya Hara, Procurement Section, Accounting Division, Department of Yonezawa Campus services, Yamagata University, 4-3-1 Jonan Yonezawa-shi Yamagata-ken 992-851 Japan, TEL 0238-26-3009

Japan

2026-03-26