Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
Sector: Advanced Electronics • Location: United Kingdom
Source: GOV.UK
The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend ...
- Status
- Closed
- Sector
- Advanced Electronics, Education, Road, Residential, Power Generation (CCGT)
- Location
- United Kingdom
- Updated
- 3 Nov 2026
- Source
- GOV.UK
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Status
Original status | active |
Taiyo status | Closed |
Taiyo last update | 2026-11-03 |
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Description
Description | The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opportunity please go to the University of Warwick In-Tend ... |
Budget |
Location
Country | United Kingdom (UK) |
Source
Source | GOV.UK |
URL |
More Details
Record type | Tender |
Sector | Advanced Electronics, Education, Road, Residential, Power Generation (CCGT) |
Article published date | 2025-12-09 |
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