X - Ray Fluorescence Spectrometer XRF

2026-11-03

X - Ray Fluorescence Spectrometer ( XRF ) SYSTEM REQUIREMENTS 1 . X - Ray Fluorescence System • Sample Type : solids , particles and liquids • Variable atmosphere conditions : 1mbar - atmosphere • Spot Size : < 20µm for Mo Ka ( 17 . 5 keV ) • Element range : C – Am • Energy resolution : < 145 eV at Mn - Kα at 300 , 000 cps input • Maximum throughput up to 550 , 000 cps output 2 . Hardware • Hardware control : GUI - based ( PC installed ) • XYZ Stage Control  Measurable area up to 200 x 160 mm ( X & Y ) • Control of the instrument  Stage  Camera  Excitation conditions  Measurement time  Instrument safety 3 . Software • Spectra acquisition , display and edit functions • Spectra evaluation  Manual and automatic qualitative analysis  Peak identification  Artifact and background correction  Peak area determination by peak fitting or deconvolution procedures  Linear and area distribution analysis by linescan and mapping functions  Single point and multi point qualitative and quantitative analysis  Quantitative analysis by standardless methods for bulk material • Distribution Analysis  Mapping capability • Data results output  Quantification results  Element distribution ( line scan , mapping ) • Software much be compatible with Windows 11 OS 4 . Shipping • Include associated cost 5 . Installation / Training • Must include standard installation and basic training

Missouri

2026-04-29